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B80 BLE Single Connection SDK Current Test Report

Test Environment

Software and Hardware

The hardware and software for the test are listed as below:

  • Test board: TLSR8208ADK56(C1T261A30_V1.1) with TLSR8208AER chip
  • SDK: 80_ble_single_connection_sdk(V3.4.1.0)
  • Test tool: Agilent Precision DC Power Analyzer(Model:N6705B), Multimeter FLUKE 287C
  • Power supply: Agilent_N6705

Test board and 8208 dongle

Test environment setup

Test Method and Test Item

Test Method

The Agilent N6705B was used to supply 2.2V and 3.3V to the test board. When the test board was advertising, the Agilent N6705B was used to record the current waveform and data in the advertising state of the test board; the test board was connected to the 8208 dongle and the Agilent N6705B was used to record the current waveform and data in the connected state of the test board.

Test Item

(1) Current test in advertising state

The current test conditions in the advertising state are as follows.

  • Power supply: 2.2V, 3.3V
  • ADV type: CONNECT_12B_1S_3CHANNEL, UNCONNECT_16B_1S_3CHANNEL
  • TX power: 0dBm, 3dBm
  • Low power Mode: Suspend, Deep Retention
  • 32K clock source: Internal 32KHz RC, External 32KHz Crystal

(2) Current test in long connection

The current test conditions in the long connection state are as follows.

  • CL (Connection Interval): 10 ms
  • SL (Slave Latency): 99
  • Power supply: 2.2V, 3.3V
  • TX power: 0dBm, 3dBm
  • Low power Mode: Suspend, Deep Retention
  • 32K clock source: Internal 32KHz RC, External 32KHz Crystal

Test in Advertising State

Test condition 1 for advertising state:

  • Power supply: 3.3V
  • ADV type: CONNECT_12B_1S_3CHANNEL
  • TX power: 3dBm
  • Low power Mode: Suspend
  • 32K clock source: Internal 32KHz RC

Current curve for advertising state test condition 1

Current data for advertising state test condition 1

Test condition 2 for advertising state:

  • Power supply: 3.3V
  • ADV type: CONNECT_12B_1S_3CHANNEL
  • TX power: 3dBm
  • Low power Mode: Deep Retention
  • 32K clock source: Internal 32KHz RC

Current curve for advertising state test condition 2

Current data for advertising state test condition 2

Test condition 3 for advertising state:

  • Power supply: 3.3V
  • ADV type: UNCONNECT_16B_1S_3CHANNEL
  • TX power: 3dBm
  • Low power Mode: Suspend
  • 32K clock source: Internal 32KHz RC

Current curve for advertising state test condition 3

Current data for advertising state test condition 3

Test condition 4 for advertising state:

  • Power supply: 3.3V
  • ADV type: UNCONNECT_16B_1S_3CHANNEL
  • TX power: 3dBm
  • Low power Mode: Deep Retention
  • 32K clock source: Internal 32KHz RC

Current curve for advertising state test condition 4

Current data for advertising state test condition 4

The average current for each test condition in the advertising state with Internal 32K RC are as follows.

Average current for each test condition in advertising state with Internal 32K RC

The average current for each test condition in the advertising state with External 32K Crystal are as follows.

Average current for each test condition in advertising state with External 32K Crystal

Test in Long Connection

Default condition: CL (Connection Interval): 10 ms, L (Slave Latency):99, L * (SL + 1) = 1 s

Test condition 1 for long connection:

  • Power supply: 3.3V
  • TX power: 3dBm
  • Low power Mode: Suspend
  • 32K clock source: Internal 32KHz RC

Current curve for long connection test condition 1

Current data for long connection test condition 1

Test condition 2 for long connection:

  • Power supply: 3.3V
  • TX power: 3dBm
  • Low power Mode: Deep Retention
  • 32K clock source: Internal 32KHz RC

Current curve for long connection test condition 2

Current data for long connection test condition 2

The average current for each test condition in the long connection are as follows.

Average current for each test condition in long connection