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TL321x BLE Multiple Connection SDK Current Test Report


Overview

The TL321x BLE Multiple Connection SDK Current Test Report applies to Telink TL321x series chip.

Test Environment

Software and Hardware

The hardware and software for the test are listed as below:

  • Test board: C1T331A20_V1.0/C1T335A20_V1.0 with TL321x chip
  • SDK: tl_ble_sdk V4.0.4.2 (Note: this report uses the optimized code based on this version, while the system clock is adjusted to XTAL_24M.)
  • Test tool: Agilent Precision DC Power Analyzer (Model: N6705B), Multimeter FLUKE 287C
  • Power supply: Agilent_N6705

Test board and 8258 dongle

Test environment setup

Test Method and Test Item

Test Method

The Agilent N6705B was used to supply 3.3V to the test board. When the test board was advertising, the Agilent N6705B was used to record the current waveform and data in the advertising state of the test board; the test board was connected to the 8258 dongle and the Agilent N6705B was used to record the current waveform and data in the connected state of the test board.

Power the test board at 3.3V using a downloader, and connect in series the multimeter FLUKE 287C into the circuit for current test in the advertising and long connection states.

Note: The tables of average current in the text for the advertising state and the long connection are based on data measured by the Multimeter FLUKE 287C, and the rest are based on data measured by the Agilent N6705B.

Test Item

(1) Current test in advertising state

The current test conditions in the advertising state are as follows.

  • Power supply: 3.3V
  • ADV type: CONNECT_12B_1S_3CHANNEL, UNCONNECT_16B_1S_3CHANNEL
  • TX power: 0dBm, 3dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: suspend, deep retention

(2) Current test in long connection

The current test conditions in the long connection state are as follows.

  • CL (Connection Interval): 10 ms
  • SL (Slave Latency): 99
  • Power supply: 3.3V
  • TX power: 0dBm, 3dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: suspend, deep retention

Test in Advertising State

CONNECT adv & 0dBm & Deep retention

Test condition 1 for advertising state (CONNECT adv & 0dBm & Deep retention):

  • Power supply: 3.3V
  • ADV type: CONNECT_12B_1S_3CHANNEL
  • TX power: 0dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: Deep retention

Current curve for advertising state test condition 1

Current data for advertising state test condition 1

UNCONNECT adv & 0dBm & Suspend

Test condition 2 for advertising state (UNCONNECT adv & 0dBm & Suspend):

  • Power supply: 3.3V
  • ADV type: UNCONNECT_16B_1S_3CHANNEL
  • TX power: 0dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: Suspend

Current curve for advertising state test condition 2

Current data for advertising state test condition 2

CONNECT adv & 3dBm & Deep retention

Test condition 3 for advertising state (CONNECT adv & 3dBm & Deep retention):

  • Power supply: 3.3V
  • ADV type: CONNECT_12B_1S_3CHANNEL
  • TX power: 3dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: Deep retention

Current curve for advertising state test condition 3

Current data for advertising state test condition 3

UNCONNECT adv & 3dBm & Suspend

Test condition 4 for advertising state (UNCONNECT adv & 3dBm & Suspend):

  • Power supply: 3.3V
  • ADV type: UNCONNECT_16B_1S_3CHANNEL
  • TX power: 3dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: Suspend

Current curve for advertising state test condition 4

Current data for advertising state test condition 4

The average current for each test condition in the advertising state with Internal 32K RC are as follows.

Average current for each test condition in advertising state with Internal 32K RC

Test in Long Connection

0dBm & Deep retention

Test condition 1 for long connection (0dBm & Deep retention):

  • CI (Connection Interval): 10 ms
  • SL (Slave Latency): 99
  • Power supply: 3.3V
  • TX power: 0dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: Deep retention

Current curve for long connection test condition 1

Current data for long connection test condition 1

3dBm & Deep retention

Test condition 2 for long connection (3dBm & Deep retention):

  • CL (Connection Interval): 10 ms
  • SL (Slave Latency): 99
  • Power supply: 3.3V
  • TX power: 3dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: Deep retention

Current curve for long connection test condition 2

Current data for long connection test condition 2

0dBm & Suspend

Test condition 3 for long connection (0dBm & Suspend):

  • CL (Connection Interval): 10 ms
  • SL (Slave Latency): 99
  • Power supply: 3.3V
  • TX power: 0dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: Suspend

Current curve for long connection test condition 3

Current data for long connection test condition 3

3dBm & Suspend

Test condition 4 for long connection (3dBm & Suspend):

  • CL (Connection Interval): 10 ms
  • SL (Slave Latency): 99
  • Power supply: 3.3V
  • TX power: 3dBm
  • Mode: LDO&DCDC mode
  • 32K clock source: Internal 32KHz RC
  • PM: Suspend

Current curve for long connection test condition 4

Current data for long connection test condition 4

The average current for each test condition in the long connection are as follows.

Average current for each test condition in long connection