Telink SoC EMI Test User Guide
Overview
The purpose of this document is to guide customers to conduct EMI test and to help customers develop EMI test related tools. It mainly includes the following two parts.
The first part introduces the test process of EMI and the selection of related tools.
The flow of test using the EMI program is:
Step1: Write the calibration parameters to the specified position of the Flash (OTP), the calibration parameters refer to some parameters related to RF performance (cap value, tp value, etc.);
Step2: Burn the corresponding EMI bin file into the DUT (Flash or SRAM);
Step3: Use the EMI test tool to switch test modes to complete different test items.
The EMI test tools provided by Telink include EMI_Test_Tool and Non_Signaling_Test_Tool, both for different test items, users can refer to the table below for tool selection.
Tool | Test items |
---|---|
EMI_Test_Tool | Output power, 20dB bandwidth, sideband, harmonic, frequency offset, frequency hopping, standing time-single packet time. |
Non_Signaling_Test_Tool | Sideband (according to customer demand), standing time: -3.16s. |
For how to select the test bin file and the test program's support for tool functions, customers can refer to chapter 2.
The second part mainly introduces the control protocol of the EMI test procedure.
How is the EMI test procedure controlled?
An area is defined in the SRAM of the DUT to store the control parameters, users can modify each control parameter through the USB or Swire interface to switch between different test modes. The control parameters include "run", "mode", "power", "channel", "cmd", "hop", etc. The functions of each parameter are shown in the table below.
Control parameter | Function |
---|---|
run | Used to control the enable and disable of the EMI test |
mode | Used to select RF working mode |
power | Used to select the energy level of Tx |
channel | Used to select the frequency point |
cmd | Used to select the mode for EMI test |
hop | Used to control whether to use frequency hopping mode (only carrier_data test mode) |
What is the control flow of the EMI program?
Step1: Modify control parameters other than "run". Generally, as long as the control parameters other than "run" change, the EMI test program will enter the idle state, that is, the "run" parameter will be set to 0.
Step2: Modify the value of the "run" parameter to 1, that is, control the EMI program to enter the specified test mode.
What is the default mode after the EMI program is powered on?
In general, the EMI program will enter the carrier mode after the DUT is powered on (the frequency point is 2402, the RF mode is ZigBee250K, and the Power is the maximum energy). Some programs are supported to modify the default mode after power-on by writing the value of the specified location in Flash, please refer to the content of chapter 3 for details.
Due to the differences in the storage locations and supported functions of the control parameters of each chip, you need to refer to chapter 3 when developing tools.
EMI_BIN Supported Function
TLSR8261
bin File Description
There are a total of 4 bin files used for 8261 EMI test, which are:
"8261_emi_test_12M_external_cap.bin", supports 12MHz crystal oscillator, uses external capacitor;
"8261_emi_test_12M_internal_cap.bin", supports 12MHz crystal oscillator, uses internal capacitor;
"8261_emi_test_16M_external_cap.bin", supports 16MHz crystal oscillator, uses external capacitor;
"8261_emi_test_16M_internal_cap.bin", supports 16MHz crystal oscillator, uses internal capacitor.
In addition, the user can configure the size of the internal capacitance (cap) and set the calibration parameter (Tp) by writing the value at the corresponding address of the Flash, refer to the table below for the specific address of each parameter in the Flash.
Parameter name | Flash address |
---|---|
cap | 0x77000 |
Tp0 | 0x77040 |
Tp1 | 0x77041 |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (supports Hop) |
RX | RxTest | |
PA | Supports custom PA | |
PM | PM | Deep, Suspend |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Supports custom PA | |
PM | PM | Deep, Suspend |
TLSR8266
bin File Description
There are a total of 4 bin files used for 8266 EMI test, which are:
"8266_12M_emi_test_external_cap.bin", supports 12MHz crystal oscillator, uses external capacitor;
"8266_12M_emi_test_internal_cap.bin", supports 12MHz crystal oscillator, uses internal capacitor;
"8266_16M_emi_test_external_cap.bin", supports 16MHz crystal oscillator, uses external capacitor;
"8266_16M_emi_test_internal_cap.bin", supports 16MHz crystal oscillator, uses internal capacitor.
In addition, the user can configure the size of the internal capacitance (cap) and set the calibration parameter (Tp) by writing the value at the corresponding address of the Flash, refer to the table below for the specific address of each parameter in the Flash.
Parameter name | Flash address |
---|---|
cap | 0x1e000 |
Tp0 | 0x1e040 |
Tp1 | 0x1e041 |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (supports Hop) |
RX | RxTest | |
PA | Supports custom PA | |
PM | PM | Not support |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Supports custom PA | |
PM | PM | Not support |
TLSR8267/8269/8646
bin File Description
There are a total of 4 bin files used for the 8267/8269/8646 EMI test, which are:
"8267_8269_8646_emi_test_12M_external_cap.bin", supports 12MHz crystal oscillator, uses external capacitor;
"8267_8269_8646_emi_test_12M_internal_cap.bin", supports 12MHz crystal oscillator, uses internal capacitor;
"8267_8269_8646_emi_test_16M_external_cap.bin", supports 16MHz crystal oscillator, uses external capacitor;
"8267_8269_8646_emi_test_16M_internal_cap.bin", supports 16MHz crystal oscillator, uses internal capacitor.
In addition, the user can configure the size of the internal capacitance (cap) and set the calibration parameter (Tp) by writing the value at the corresponding address of the Flash, refer to the table below for the specific address of each parameter in the Flash.
Parameter name | Flash address |
---|---|
cap | 0x77000 |
Tp0 | 0x77040 |
Tp1 | 0x77041 |
Test Tool Supported Function
For the functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files, please refer to tables 2.2 and 2.3 in chapter 2.1.2.
TLSR8366
bin File Description
The bin file used for the 8366 EMI test is:
"8366_EMI_V0001.bin", uses internal capacitor.
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (Hop is not supported) |
RX | RxTest | |
PA | Not support | |
PM | PM | Not support |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Not support | |
PM | PM | Not support |
TLSR8367/8369
bin File Description
The bin files used for the 8367/8369 EMI test are:
"8369_EMI_ExternalCap_VXXX.bin", uses external capacitor;
"8369_EMI_InternalCap_VXXX.bin", uses internal capacitor.
In addition, the user can configure the size of the internal capacitance (cap) and set the calibration parameter (Tp) by writing the value at the corresponding address of the OTP, refer to the table below for the specific address of each parameter in the OTP.
Parameter name | OTP address |
---|---|
cap | 0x3FA8 |
Tp0 | 0x3FA6 |
Tp1 | 0x3FA7 |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (Hop is not supported) |
RX | RxTest | |
PA | Supports custom PA | |
PM | PM | Not support |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Supports custom PA | |
PM | PM | Not support |
TLSR8232
bin File Description
The bin files used for the 8232 EMI test are:
"8232_EMI_ExternalCap_VXXXX.bin", uses external capacitor;
"8232_EMI_InternalCap_VXXXX.bin", uses internal capacitor.
In addition, the user can configure the size of the internal capacitance (cap) and set the calibration parameter (Tp) by writing the value at the corresponding address of the Flash, refer to the table below for the specific address of each parameter in the Flash.
Parameter | Flash address |
---|---|
cap | 0xE000(64K), 0x1E000(128K/256K), 0x77000(512K) |
Tp0 | 0xE040(64K), 0x1E040(128K/256K), 0x77040(512K) |
Tp1 | 0xE041(64K), 0x1E041(128K/256K), 0x77041(512K) |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (Hop is not supported) |
RX | RxTest | |
PA | Supports custom PA | |
PM | PM | Not support |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Supports custom PA | |
PM | PM | Not support |
TLSRB80
bin File Description
The bin files used for the B80 EMI test are:
"B80_EMI_CapExternal_CalibFlash_ProgramFlashSRAM_VXXXX.bin", uses external capacitor, reads calibration values from Flash, which can be downloaded to SRAM or Flash to run;
"B80_EMI_CapInternal_CalibFlash_ProgramFlashSRAM_VXXXX.bin", uses internal capacitor, reads calibration values from Flash, which can be downloaded to SRAM or Flash to run;
"B80_EMI_CapExternal_CalibOTP_ProgramFlashSRAM_VXXXX.bin", uses external capacitor, reads calibration values from OTP, which can be downloaded to SRAM or Flash to run;
"B80_EMI_CapInternal_CalibOTP_ProgramFlashSRAM_VXXXX.bin", uses internal capacitor, reads calibration values from OTP, which can be downloaded to SRAM or Flash to run.
In addition, the user can configure the size of the internal capacitance (cap) by writing the value in the corresponding address of Flash or OTP. The specific address is shown in the following table.
Parameter name | Flash address | OTP address |
---|---|---|
cap | 0x1E000(128K), 0x77000(512K), 0xFE000(1M) | 0x3FC8 |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (supports Hop) |
RX | RxTest | |
PA | Supports custom PA | |
PM | PM | Deep, Suspend, Deep with retension |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Supports custom PA | |
PM | PM | Deep, Suspend, Deep with retension |
TLSRB85
bin File Description
The bin file used for B85 EMI test is:
"B85_EMI_InternalCap_VXXXX.bin", uses internal capacitor.
In addition, the user can configure the size of the internal capacitance (cap) by writing the value in the corresponding address of the Flash. The specific address is shown in the table below.
Parameter name | Flash address |
---|---|
cap | 0x1E000(128K), 0x77000(512K) |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (supports Hop) |
RX | RxTest | |
PA | Supports custom PA | |
PM | PM | Deep, Suspend, Deep with retension |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Supports custom PA | |
PM | PM | Deep, Suspend, Deep with retension |
TLSRB87
bin File Description
The bin files used for the B87 EMI test are:
"B87_EMI_DCDC_ExternalCap_VXXXX.bin", adopts DCDC power supply mode, uses external capacitor;
"B87_EMI_DCDC_InternalCap_VXXXX.bin", adopts DCDC power supply mode, uses internal capacitor;
"B87_EMI_LDO_ExternalCap_VXXXX.bin", adopts LDO power supply mode, uses external capacitor;
"B87_EMI_LDO_InternalCap_VXXXX.bin", adopts LDO power supply mode, uses internal capacitor.
In addition, the user can configure the size of the internal capacitance (cap) by writing the value in the corresponding address of the Flash. The specific address is shown in the table below.
Parameter name | Flash address |
---|---|
cap | 0x1E000(128K), 0x77000(512K), 0xFE000(1M) |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (supports Hop) |
RX | RxTest | |
PA | Supports custom PA | |
PM | PM | Deep, Suspend, Deep with retension |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Supports custom PA | |
PM | PM | Deep, Suspend, Deep with retension |
TLSRB89
bin File Description
The bin files used for the B89 EMI test are:
"B89_EMI_CapExternal_PowerDCDC_CalibFlash_ProgramFlashSRAM_VXXXX.bin", adopts DCDC power supply mode, uses external capacitor, reads calibration values from Flash, which can be downloaded to SRAM or Flash to run;
"B89_EMI_CapInternal_PowerDCDC_CalibFlash_ProgramFlashSRAM_VXXXX.bin", adopts DCDC power supply mode, uses internal capacitor, reads calibration values from Flash, which can be downloaded to SRAM or Flash to run;
"B89_EMI_CapExternal_PowerDCDC_CalibOTP_ProgramFlashSRAM_VXXXX.bin", adopts DCDC power supply mode, uses external capacitor, reads calibration values from OTP, which can be downloaded to SRAM or Flash to run;
"B89_EMI_CapInternal_PowerDCDC_CalibOTP_ProgramFlashSRAM_VXXXX.bin", adopts DCDC power supply mode, uses internal capacitor, reads calibration values from OTP, which can be downloaded to SRAM or Flash to run.
In addition, the user can configure the size of the internal capacitance (cap) by writing the value in the corresponding address of Flash or OTP. The specific address is shown in the following table.
Parameter name | Flash address | OTP address |
---|---|---|
cap | 0x1E000(128K), 0x77000(512K), 0xFE000(1M) | 0x7F14 |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (supports Hop) |
RX | RxTest | |
PA | Supports custom PA | |
PM | PM | Deep,Suspend, Deep with retension |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Supports custom PA | |
PM | PM | Deep, Suspend, Deep with retension |
TLSRB91
bin File Description
The bin files used for the B91 EMI test can be generated by EMI_TOOL in the BDT tool.
The user can configure the size of the internal capacitance (cap) by writing the value in the corresponding address of the Flash. The specific address is shown in the table below.
Parameter name | Flash address |
---|---|
cap | 0x7E000(512K), 0xFE000(1M), 0x1FE000(2M) |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (supports Hop) |
RX | RxTest | |
PA | Custom PA is supported | |
PM | PM | Deep, Suspend, Deep with retension are not supported |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Custom PA is supported | |
PM | PM | Deep, Suspend, Deep with retension are not supported |
TLSRB92
bin File Description
The bin files used for the B92 EMI test can be generated by EMI_TOOL in the BDT tool.
The user can configure the size of the internal capacitance (cap) by writing the value in the corresponding address of the Flash. The specific address is shown in the table below.
Parameter name | Flash address |
---|---|
cap | 0xE000(64K),0x1E000(128K),0x7E000(512K),0xFE000(1M),0x1FE000(2M),0x3FE000(4M) |
Test Tool Supported Function
The functional support of "EMI_Tool" and "Non_Signaling_Test_Tool" for the above bin files is shown in the following table.
Category 1 | Category 2 | Supported function |
---|---|---|
RF | Carrier | Carrier, CarrierData (supports Hop) |
RX | RxTest | |
PA | Custom PA is supported | |
PM | PM | Deep, Suspend, Deep with retension are not supported |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | PRBS9, 0x55, 0xf (supports cyclic sending and single sending of 1000 packets) |
RX | RxTest, Read_Rx_Cnt, ReadRssi | |
PA | Custom PA is supported | |
PM | PM | Deep, Suspend, Deep with retension are not supported |
Category 1 | Category 2 | Supported function |
---|---|---|
RF | TX | TX current |
RX | RX current | |
PM | PM | Deep, Suspend, Deep with retension are not supported |
Control Protocol
This chapter mainly introduces the control parameters of each chip and their corresponding functions in detail. Besides to the control parameters mentioned above, there are also some parameters used to obtain test information (such as RSSI value, number of received packets, etc.). In addition, some chips support custom configuration of PA control pins, and two new control parameters "pa_tx_pin" and "pa_rx_pin" are added, which are used to configure the tx and rx pins of the PA respectively.
TLSR8261
The detailed description of each parameter of TLSR8261 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 1 | SRAM: 0x808006 |
mode | 0: ble_2M;1: ble_1M;2: zigbee | 1 | Flash: 0xF00A; SRAM: 0x80800A |
power | 0: 7dBm;1: 6dBm;2: 5dBm; 3: -0.6dBm;4: -4.3dBm;5: -9.5dBm; 6: -11dBm;7: -11.5dBm;8: -12dBm; 9: -13dBm;10: -14dBm;11: -15dBm; 12: -18.8dBm;13: -23.3dBm;14: -27.5dBm; 15: -30dBm; 16: -37dBm; 17: Disable PA |
0 | Flash: 0xF008; SRAM: 0x808008 |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | |
cmd | 1: emi_carrier_only;2: emi_carrier_data; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f 7: pm_pad_deep;8: pm_32kTimer_deep; 9: pm_pad_suspend; 10: pm_32kTImer_suspend |
1 | Flash: 0xF007; SRAM: 0x808007 |
hop | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x80800B |
cap | 0xbf< cap< 0xe0 | - | Flash: 0x1E000 |
Tp0 | BLE 1M: 0x13 < Tp0 < 0x27;BLE 2M: 0x36 < Tp0 < 0x4a | - | Flash: 0x1E040 |
Tp1 | BLE 1M: 0x0f < Tp0 < 0x23;BLE 2M: 0x2f < Tp0 < 0x43 | - | Flash: 0x1E041 |
rssi | read only (1 byte) | - | SRAM: 0x808004 |
tx_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | 0 | SRAM: 0x808005 |
rx_packet_num | read only (4 bytes) | - | SRAM: 0x80800C |
TLSR8266
The detailed description of each parameter of TLSR8266 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 1 | SRAM: 0x808006 |
mode | 0: ble_2M;1: ble_1M;2: zigbee | 1 | Flash: 0x3F00A; SRAM: 0x80800A |
power | 0: 7dBm;1: 5dBm;2: -0.6dBm; 3: -4.3dBm;4: -9.5dBm; 5: -13.6dBm; 6: -18.8dBm;7: -23.3dBm;8: -27.5dBm; 9: -30dBm; 10: -37dBm; 11: Disable PA |
0 | Flash: 0x3F008; SRAM: 0x808008 |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | Flash: 0x3F009; SRAM: 0x808009 |
cmd | 1: emi_carrier_only;2: emi_carrier_data; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f |
1 | Flash: 0x3F007; SRAM: 0x808007 |
hop | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x80800B |
cap | 0xbf < cap< 0xe0 | - | Flash: 0x77000 |
Tp0 | BLE 1M: 0x15 < Tp0 < 0x29;BLE 2M: 0x39 < Tp0 < 0x4a | - | Flash: 0x77040 |
Tp1 | BLE 1M: 0x11 < Tp0 < 0x25;BLE 2M: 0x32 < Tp0 < 0x46 | - | Flash: 0x77041 |
rssi | read only (1 byte) | - | SRAM: 0x808004 |
tx_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | - | SRAM: 0x808005 |
rx_packet_num | read only (4 bytes) | - | SRAM: 0x80800cC |
TLSR8267/8269/8646
The detailed description of each parameter of TLSR8267/8269/8646 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 1 | SRAM: 0x808006 |
mode | 0: ble_2M;1: ble_1M;2: zigbee | 1 | Flash: 0x3F00A; SRAM: 0x80800a |
power | 0: 7dBm;1: 6dBm;2: 5dBm; 3: -0.6dBm;4: -4.3dBm;5: -9.5dBm; 6: -11dBm;7: -11.5dBm;8: -12dBm; 9: -13dBm;10: -14dBm;11: -15dBm; 12: -18.8dBm;13: -23.3dBm;14: -27.5dBm; 15: -30dBm; 16: -37dBm; 17: Disable PA |
0 | Flash: 0x3F008; SRAM: 0x808008 |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | Flash: 0x3F009; SRAM: 0x808009 |
cmd | 1: emi_carrier_only;2: emi_carrier_data; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f; 7: pm_pad_deep;8: pm_32kTimer_deep; 9: pm_pad_suspend; 10: pm_32kTImer_suspend |
1 | Flash: 0x3F007; SRAM: 0x808007 |
hop | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x80800B |
cap | 0xbf < cap< 0xe0 | - | Flash: 0x77000 |
Tp0 | BLE 1M: 0x13 < Tp0 < 0x27;BLE 2M: 0x36 < Tp0 < 0x4a | - | Flash: 0x77040 |
Tp1 | BLE 1M: 0x0f < Tp0 < 0x23;BLE 2M: 0x2f < Tp0< 0x43 | - | Flash: 0x77041 |
rssi | read only (1 byte) | - | SRAM: 0x808004 |
tx_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | - | SRAM: 0x808005 |
rx_packet_num | read only (4 bytes) | - | SRAM: 0x80800C |
TLSR8366
The detailed description of each parameter of TLSR8366 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 1 | SRAM: 0x808006 |
mode | 0: Private_2M | 0 | SRAM: 0x80800A |
power | 0: 8dBm;1: 4dBm;2: 3dBm; 3: 2dBm; 4: 0dBm;5: -4dBm; 6: -8dBm;7: -12dBm;8: -16dBm; 9: -20dBm;10: -24dBm;11: -28dBm; 12: -32dBm |
1 | SRAM: 0x808008 |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | SRAM: 0x808009 |
cmd | 1: emi_carrier_only;2: emi_con_prbs9; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f |
1 | SRAM: 0x808007 |
rssi | read only (1 byte) | - | SRAM: 0x808004 |
tx_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | 0 | SRAM: 0x808005 |
rx_packet_num | read only (4 bytes) | - | SRAM: 0x80800C |
TLSR8367/8369
The detailed description of each parameter of TLSR8367/8369 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 1 | SRAM: 0x808006 |
mode | 0: ble_1M_NO_PN;1: ble_2M_NO_PN; 3: Private_1M; 4: Private_2M |
0 | SRAM: 0x80800A |
power | 0: 7dBm;1: 6dBm;2: 3dBm; 3: 2dBm;4: 0dBm;5: -1dBm; 6: -2dBm;7: -10dBm;8: -12dBm; 9: -14dBm; 10: -15dBm; 11: -17dBm |
1 | SRAM: 0x808008 |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | SRAM: 0x808009 |
cmd | 1: emi_carrier_only;2: emi_con_prbs9; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f |
1 | SRAM: 0x808007 |
hop | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x80800B |
cap | 0xbf < cap < 0xe0 | - | Flash: 0x77000 |
Tp0 | 0 < Tp0 < 0xff | - | Flash: 0x77040 |
Tp1 | 0 < Tp1 < 0xff | - | Flash: 0x77041 |
rssi | read only (1 byte) | - | SRAM: 0x808004 |
tx_mode | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x808005 |
rx_packet_num | read only (4 bytes) | - | SRAM: 0x80800C |
pa_tx_pin | (port_v << 3) | bit_v example: PB4 = ((‘B’-‘A’) << 3) | (‘4’-‘0’) = 0x0C |
0 | SRAM: 0x808014 |
pa_rx_pin | the setting method is the same as pa_tx_pin | 0 | SRAM: 0x808015 |
TLSR8232
The detailed description of each parameter of TLSR8232 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 0 | SRAM: 0x808006 |
mode | 0: ble_2M;1: ble_1M;2: zigbee; 3: Private_2M; 4: Private_1M |
1 | SRAM: 0x80800A |
power | 0: 7.9dBm;1: 7dBm;2: 6.3dBm; 3: 4.9dBm;4: 3.3dBm; 5: 1.6dBm; 6: 0dBm;7: -1.5dBm;8: -3.1dBm; 9: -5dBm;10: -7.3dBm;11: -9.6dBm; 12: -11.5dBm;13: -13.3dBm;14: -16dBm; 12: -11.5dBm;13: -13.3dBm;14: -16dBm; 15: -17.8dBm;16: -19.5dBm |
0 | SRAM: 0x808008 |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | SRAM: 0x808009 |
cmd | 1: emi_carrier_only;2: emi_con_prbs9; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f |
1 | SRAM: 0x808007 |
hop | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x80800B |
cap | 0xbf < cap < 0xe0 | - | Flash: 0x77000 |
Tp0 | 0 < Tp0 < 0xff | - | Flash: 0x77040 |
Tp1 | 0 < Tp1 < 0xff | - | Flash: 0x77041 |
rssi | read only (1 byte) | - | SRAM: 0x808004 |
tx_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | 0 | SRAM: 0x808005 |
rx_packet_num | read only (4 bytes) | - | SRAM: 0x80800C |
pa_tx_pin | (port_v << 3) | bit_v example: PB4 = ((‘B’-‘A’) << 3) | (‘4’-‘0’) = 0x0C |
0 | SRAM: 0x808014 |
pa_rx_pin | the setting method is the same as pa_tx_pin | 0 | SRAM: 0x808015 |
TLSRB80
The detailed description of each parameter of TLSRB80 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 1 | SRAM: 0x840006 |
mode | 0: BLE_2M;1: BLE_1M;2: Zigbee_250K; 3: BLE_125k;4: BLE_500k;5: Private_2M; 6: Private_1M Note: Zigbee_250K mode only supports TX |
1 | SRAM: 0x84000A Flash: 0x1C004(128K), 0x7C004(512K), 0x7C004(1M) |
power | 0:11.5dbm;1:11.3dbm;2:11.0dbm; 3:10.8dbm;4:10.4dbm;5:10.2dbm; 6:9.9dbm;7:9.6dbm;8:9.3dbm; 9:9.0dbm;10:8.6dbm;11:8.3dbm; 12:7.8dbm;13:7.4dbm;14:7.0dbm; 15:6.4dbm;16:5.9dbm;17:5.5dbm; 18:4.7dbm;19:4.1dbm;20:4.0dbm; 21:3.7dbm;22:3.5dbm;23:3.2dbm; 24:2.9dbm;25:2.6dbm;26:2.3dbm; 27:2.0dbm;28:1.7dbm;29:1.3dbm; 30:0.8dbm;31:0.6dbm;32:-0.2dbm; 33:-0.4dbm;34:-0.7dbm;35:-1.2dbm; 36:-1.7dbm;37:-2.3dbm;38:-2.8dbm; 39:-3.5dbm;40:-4.2dbm;41:-5.0dbm; 42:-5.9dbm;43:-6.8dbm;44:-8.0dbm; 45:-9.3dbm;46:-10.8dbm;47:-12.8dbm; 48:-15.0dbm;49:-18.4dbm;50:-24.3dbm |
0 | SRAM: 0x840008 Flash: 0x1C002(128K), 0x7C002(512K), 0x7C002(1M) |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | SRAM: 0x840009 Flash: 0x1C003(128K), 0x7C003(512K), 0x7C003(1M) |
cmd | 1: emi_carrier_only;2: emi_con_prbs9; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f; 7: emi_deep_io_no_retension; 8: emi_deep_timer_no_retension; 9: emi_suspend_io_no_retension; 10: emi_suspend_timer_no_retension; 11: emi_deep_io_retension; 12: emi_deep_timer_retension |
1 | SRAM: 0x840007 Flash: 0x1C001(128K), 0x7C001(512K), 0x7C001(1M) |
hop | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x84000B Flash: 0x1C005(128K), 0x7C005(512K), 0x7C005(1M) |
cap | 0x40 < cap < 0x7f | - | Flash: 0x1E000(128K), 0x77000(512K), 0x7E000(1M) OTP: 0x3FC8 |
cap_close_en | 0xff: enable internal capacitor; 0: disable internal capacitor | 0xff | Flash: 0x1C006(128K), 0x7C006(512K), 0xFC006(1M) |
rssi | read only (1 byte) | - | SRAM: 0x840004 |
tx_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | 0 | SRAM: 0x840005 Flash: 0x1C000(128K), 0x7C000(512K), 0xFC000(1M) |
rx_packet_num | read only (4 bytes) | - | SRAM: 0x84000C |
pa_tx_pin | (port_v << 3) | bit_v example: PB4 = ((‘B’-‘A’) << 3) | (‘4’-‘0’) = 0x0C |
0 | SRAM: 0x840014 |
pa_rx_pin | the setting method is the same as pa_tx_pin | 0 | SRAM: 0x840015 |
TLSRB85
The detailed description of each parameter of TLSRB85 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 1 | SRAM: 0x840006 |
mode | 0: BLE_2M;1: BLE_1M;2: Zigbee_250K; 3: BLE_125k;4: BLE_500k;5: Private_2M; 6: Private_1M |
1 | SRAM: 0x84000A Flash: 0x1C004(128K), 0x7C004(512K) |
power | 0: 10.5dBm;1: 10.3dBm;2: 10.0dBm; 3: 9.8dBm;4: 9.5dBm;5: 9.2dBm; 6: 9.0dBm;7: 8.7dBm;8: 8.4dBm; 9: 8.1dBm;10: 7.8dBm;11: 7.4dBm; 12: 7.0dBm;13: 6.6dBm;14: 6.1dBm; 15: 5.6dBm;16: 5.1dBm; 17: 4.6dBm; 18: 3.9dBm;19: 3.2dBm;20: 3.0dBm; 21: 2.1dBm;22: 2.6dBm;23: 2.4dBm; 24: 2.0dBm;25: 1.7dBm;26: 1.4dBm; 27: 1.1dBm;28: 0.9dBm;29: 0.5dBm; 30: 0.0dBm;31: -0.1dBm;32: -0.9dBm; 33: -1.4dBm;34: -1.8dBm;35: -2.5dBm; 36: -3.0dBm;37: -3.6dBm;38: -4.2dBm; 39: -5.0dBm;40: -5.8dBm;41: -6.6dBm; 42: -7.6dBm;43: -8.6dBm;44: -9.8dBm; 45: -11.4dBm;46: -13.2dBm;47: -15.8dBm; 48: -19.2dBm;49: -25.1dBm |
0 | SRAM: 0x840008 Flash: 0x1C002(128K), 0x7C002(512K) |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | SRAM: 0x840009 Flash: 0x1C003(128K), 0x7C003(512K) |
cmd | 1: emi_carrier_only;2: emi_con_prbs9; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f; 7: emi_deep_io_no_retension; 8: emi_deep_timer_no_retension; 9: emi_suspend_io_no_retension; 10: emi_suspend_timer_no_retension; 11: emi_deep_io_retension; 12: emi_deep_timer_retension |
1 | SRAM: 0x840007 Flash: 0x1C001(128K), 0x7C001(512K) |
hop | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x84000B Flash: 0x1C005(128K), 0x7C005(512K) |
cap | 0x40 < cap < 0x7f | - | Flash: 0x1E000(128K), 0x77000(512K) |
cap_close_en | 0xff: enable internal capacitor; 0: disable internal capacitor | 0xff | Flash: 0x1C006(128K), 0x7C006(512K) |
rssi | read only (1 byte) | - | SRAM: 0x840004 |
tx_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | 0 | SRAM: 0x840005 Flash: 0x1C000(128K), 0x7C000(512K) |
rx_packet_num | read only (4 bytes) | - | SRAM: 0x84000C |
pa_tx_pin | (port_v << 3) | bit_v example: PB4 = ((‘B’-‘A’) << 3) | (‘4’-‘0’) = 0x0C |
0 | SRAM: 0x840014 |
pa_rx_pin | the setting method is the same as pa_tx_pin | 0 | SRAM: 0x840015 |
TLSRB87
The detailed description of each parameter of TLSRB87 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 0 | SRAM: 0x840006 |
mode | 0: BLE_2M;1: BLE_1M;2: Zigbee_250K; 3: BLE_125k;4: BLE_500k;5: Private_2M; 6: Private_1M |
1 | SRAM: 0x84000A Flash: 0x1C004(128K), 0x7C004(512K), 0x7C004(1M) |
power | 0: 11.3dBm;1: 11.1dBm;2: 10.8dBm; 3: 10.6dBm;4: 10.3dBm;5: 10.1dBm; 6: 9.8dBm;7: 9.5dBm;8: 9.2dBm; 9: 8.9dBm;10: 8.6dBm;11: 8.2dBm; 12: 7.8dBm;13: 7.4dBm;14: 6.9dBm; 15: 6.5dBm;16: 5.9dBm;17: 5.3dBm; 18: 4.7dBm;19: 4.0dBm;20: 3.5dBm; 21: 3.3dBm;22: 3.1dBm;23: 2.9dBm; 24: 2.6dBm;25: 2.4dBm;26: 2.1dBm; 27: 1.8dBm;28: 1.6dBm;29: 1.3dBm; 30: 0.7dBm;31: 0.5dBm;32: -0.3dBm; 33: -0.5dBm;34: -0.7dBm;35: -1.2dBm; 36: -1.7dBm;37: -2.2dBm;38: -2.8dBm; 39: -3.5dBm;40: -4.2dBm;41: -5.0dBm; 42: -5.9dBm;43: -6.8dBm;44: -7.9dBm; 45: -9.1dBm;46: -10.7dBm;47: -12.6dBm; 48: -15.0dBm;49: -18.4dBm 50: -24.3dBm |
0 | SRAM: 0x840008 Flash: 0x1C002(128K), 0x7C002(512K), 0xFC002(1M) |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | SRAM: 0x840009 Flash: 0x1C003(128K), 0x7C003(512K), 0xFC003(1M) |
cmd | 1: emi_carrier_only;2: emi_con_prbs9; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f; 7: emi_deep_io_no_retension; 8: emi_deep_timer_no _retension; 9: emi_suspend_io_no_retension; 10: emi_suspend_timer_no_retension; 11: emi_deep_io_retension; 12: emi_deep_timer_retension |
1 | SRAM: 0x840007 Flash: 0x1C001(128K), 0x7C001(512K), 0xFC001(1M) |
hop | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x84000B Flash: 0x1C005(128K), 0x7C005(512K), 0xFC005(1M) |
cap | 0x00 < cap < 0x7f | - | Flash: 0x1E000(128K), 0x77000(512K), 0xFE000(1M) |
cap_close_en | 0xff: enable internal capacitor; 0: disable internal capacitor | 0xff | Flash: 0x1C006(128K), 0x7C006(512K), 0xFC006(1M) |
rssi | read only (1 byte) | - | SRAM: 0x840004 |
tx_num_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | 0 | SRAM: 0x840005 Flash: 0x1C000(128K), 0x7C000(512K), 0xFC000(1M) |
rx_packet_num | read only (4 bytes) | - | SRAM: 0x84000c |
pa_tx_pin | (port_v << 3) | bit_v example: PB4 = ((‘B’-‘A’) << 3) | (‘4’-‘0’) = 0x0C |
0 | SRAM: 0x840014 |
pa_rx_pin | the setting method is the same as pa_tx_pin | 0 | SRAM: 0x840015 |
TLSRB89
The detailed description of each parameter of TLSRB89 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 1 | SRAM: 0x840006 |
mode | 0: BLE_2M;1: BLE_1M;2: Zigbee_250K; 3: BLE_125k; 4: BLE_500k;5: Private_2M; 6: Private_1M Note: Zigbee_250K mode only supports TX |
1 | SRAM: 0x84000A Flash: 0x1C004(128K), 0x7C004(512K), 0x7C004(1M) |
power | 0:5.0dbm;1:4.0dbm;2:3.1dbm; 3:2.1dbm;4:1.1dbm;5:0.7dbm; 6:-0.1dbm;7:-0.7dbm;8:-1.8dbm; 9:-2.5dbm;10:-3.4dbm;11:-4.3dbm; 12:-5.5dbm;13:-6.8dbm;14:-9.4dbm; 15:-11.8dbm;16:-15.2dbm;17:-20.7dbm; 18:-26.5dbm |
0 | SRAM: 0x840008 Flash: 0x1C002(128K), 0x7C002(512K), 0x7C002(1M) |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | SRAM: 0x840009 Flash: 0x1C003(128K), 0x7C003(512K), 0x7C003(1M) |
cmd | 1: emi_carrier_only;2: emi_con_prbs9; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f; 7: emi_deep_io_no_retension; 8: emi_deep_timer_no_retension; 9: emi_suspend_io_no_retension; 10: emi_suspend_timer_no_retension; 11: emi_deep_io_retension; 12: emi_deep_timer_retension |
1 | SRAM: 0x840007 Flash: 0x1C001(128K), 0x7C001(512K), 0x7C001(1M) |
hop | the following two modes can be configured for cmd(2): 0: disable frequency hopping mode; 1: enable frequency hopping mode | 0 | SRAM: 0x84000B Flash: 0x1C005(128K), 0x7C005(512K), 0x7C005(1M) |
cap | 0x40 < cap < 0x7f | - | Flash: 0x1E000(128K), 0x77000(512K), 0x7E000(1M) OTP: 0x7F14 |
rssi | read only (1 byte) | - | SRAM: 0x840004 |
tx_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | 0 | SRAM: 0x840005 Flash: 0x1C000(128K), 0x7C000(512K), 0xFC000(1M) |
rx_packet_num | read only (1 byte) | - | SRAM: 0x84000C |
pa_tx_pin | (port_v << 3) | bit_v example: PB4 = ((‘B’-‘A’) << 3) | (‘4’-‘0’) = 0x0C |
0 | SRAM: 0x840014 |
pa_rx_pin | the setting method is the same as pa_tx_pin | 0 | SRAM: 0x840015 |
TLSRB91
The detailed description of each parameter of TLSRB91 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 0 | SRAM: 0xC0000006 |
mode | 0: BLE_2M;1: BLE_1M;2: Zigbee_250K; 3: BLE_125k;4: BLE_500k;5: Private_2M; 6: Private_1M |
1 | SRAM: 0xC000000A |
power | 0: 9.1dBm;1: 8.6dBm;2: 8.1dBm; 3: 7.5dBm;4: 7.0dBm;5: 6.0dBm; 6: 4.4dBm;7: 3.8dBm;8: 3.3dBm; 9: 2.8dBm;10: 2.3dBm;11: 1.7dBm; 12: 0.8dBm;13: 0dBm;14: -0.5dBm; 15: -1.4dBm;16: -2.0dBm;17: -3.4dBm; 18: -4.8dBm;19: -6.5dBm;20: -8.8dBm; 21: -12.1dBm;22: -17.8dBm;23: -23.5dBm |
0 | SRAM: 0xC0000008 |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | SRAM: 0xC0000009 |
cmd | 1: emi_carrier_only;2: emi_con_prbs9; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f |
1 | SRAM: 0xC0000007 |
cap | 0x40 < cap < 0x7f | - | Flash: 0x7E000(512K), 0xFE000(1M), 0x1FE000(2M) |
rssi | read only (1 byte) | - | SRAM: 0xC0000004 |
tx_num_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | 0 | SRAM: 0xC0000005 |
rx_packet_num | read only (4 bytes) | - | SRAM: 0xC000000C |
TLSRB92
The detailed description of each parameter of TLSRB92 is shown in the following table.
Parameter | Value description | Default value | Storage address |
---|---|---|---|
run | 0: stop EMI test; 1: start EMI test | 0 | SRAM: 0xC0000006 |
mode | 0: BLE_2M;1: BLE_1M;2: Zigbee_250K; 3: BLE_125k;4: BLE_500k;5: Private_2M; 6: Private_1M |
1 | SRAM: 0xC000000A |
power | 0: 10.2dBm;1: 9.1dBm;2: 8.8dBm; 3: 8.2dBm;4: 7.7dBm;5: 6.6dBm; 6: 5.2dBm;7: 4.7dBm;8: 4.2dBm; 9: 3.7dBm;10: 3.3dBm;11: 2.8dBm; 12: 2.3dBm;13: 1.3dBm;14: 0.6dBm; 15: 0.1dBm;16: -0.8dBm;17: -1.4dBm; 18: -2.5dBm;19: -3.9dBm;20: -5.5dBm; 21: -7.8dBm;22: -12.0dBm;23: 15.4dBm; 24: -21.4dBm |
0 | SRAM: 0xC0000008 |
channel | frequency = (2400+channel) MHz(0≤channel≤100) | 2 | SRAM: 0xC0000009 |
cmd | 1: emi_carrier_only;2: emi_con_prbs9; 3: emi_rx_test;4: emi_tx_prbs9; 5: emi_tx_0x55;6: emi_tx_0x0f |
1 | SRAM: 0xC0000007 |
cap | 0x40 < cap < 0x7f | - | Flash: 0xE000(64K), 0x1E000(128K), 0x7E000(512K), 0xFE000(1M), 0x1FE000(2M), 0x3FE000(4M) |
rssi | read only (1 byte) | - | SRAM: 0xC0000004 |
tx_num_mode | for cmd (4/5/6), the following two modes can be configured: 1: send 1000 packets; 0: send packets all the time | 0 | SRAM: 0xC0000005 |
rx_packet_num | read only (4 bytes) | - | SRAM: 0xC000000C |